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    • EM Sample Preparation
      • High Pressure Freezer HPM100 (Leica Microsystems)
      • High Pressure Freezer HPM-010 (Abra-Fluid)
      • Automated Freeze Substitution
      • Cryo-Ultramicrotomy
      • Confocal Microscopy with Cryostage
      • Automated Plunge Freezing
      • Room Temperature Ultramicrotomy
      • Fluorescence Stereo Microscopy
      • Carbon Coating
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    • Transmission Electron Microscopy
      • Titan Krios (FEI Company)
      • TECNAI F30 (FEI Company)
      • CM12 (FEI Company)
    • Scanning Electron Microscopy
      • FIB-SEM, FEI Helios (FEI Company)
      • FESEM S-4500 I (Hitachi)
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Scanning Electron Microscopes

Two scanning electron microscopes are part of the FCEM. 

 

The FEI Helios is a dual beam machine (focused-ion beam in addition to the electron beam) that is heavily used mainly by cellular biology groups. The volume imaging capabilities of this system are in the process of being strengthened by implementing serial block face scanning EM (SBF-EM). 

Classical SEM imaging is done on an FESEM S-4500 I.

 

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