FIB-SEM, FEI Helios (FEI Company)
Combined focused-ion beam scanning electron microscope. Equipped with SE and BSE detectors. The software "Slice and View" (FEI Company) allows visualization of large volumes in an automated fashion. Heavily used mainly by cellular biology groups. The volume imaging capabilities of this system are in the process of being strengthened by implementing serial block face scanning EM (SBF-EM) which has already been positively evaluated by the funding body.
Location: Room 0.616, BMLS